SD041-11-11-211
Infrared-Optimized Photodiode

From Silicon Detector Corporation

@V(R) (V) (Test Condition)5.0
@Wavelength(m)(Test Condition)900n
C(T) Max. (F) Capacitance85p
Ioff Max.(A) Off-state Current100p
NEP Max.(W/(Hz)1/2)7.3f
PackageTO-46
Photosensitive Area (mm2).85
Re Min.(A/W) Responsivity500m
Semiconductor MaterialSilicon
Spectral Response High (m)1.1u
Spectral Response Low (m)300n
t(resp) Max.(s) Response Time9.0n

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