BUK481-60AT/R
N-Channel Enhancement MOSFET

From Philips Semiconductors / NXP Semiconductors

@(VDS) (V) (Test Condition)30
@Freq. (Hz) (Test Condition)1.0M
@I(D) (A) (Test Condition)1.6
@Temp (°C) (Test Condition)125
@V(DS) (V) (Test Condition)25
@V(GS) (V) (Test Condition)10
Absolute Max. Power Diss. (W)1.5
C(iss) Max. (F)240p
I(D) Abs. Drain Current (A)1.6
I(D) Abs. Max.(A) Drain Curr.1.0
I(DM) Max (A)(@25°C)6.4
I(DSS) Max. (A)1.0m
I(DSS) Min. (A)100u
I(GSS) Max. (A)100n
MilitaryN
PackageSOT-223
Thermal Resistance Junc-Amb.85
V(BR)DSS (V)60
V(BR)GSS (V)30
V(GS)th Max. (V)4.0
V(GS)th Min. (V)2.1
g(fs) Max, (S) Trans. conduct,1.5
g(fs) Min. (S) Trans. conduct.1.0
r(DS)on Max. (Ohms)350m
t(d)off Max. (s) Off time20n
t(f) Max. (s) Fall time.25n
t(r) Max. (s) Rise time35n
td(on) Max (s) On time delay10n

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