BUK481-60AT/R N-Channel Enhancement MOSFET
From Philips Semiconductors / NXP Semiconductors
@(VDS) (V) (Test Condition) | 30 |
@Freq. (Hz) (Test Condition) | 1.0M |
@I(D) (A) (Test Condition) | 1.6 |
@Temp (°C) (Test Condition) | 125 |
@V(DS) (V) (Test Condition) | 25 |
@V(GS) (V) (Test Condition) | 10 |
Absolute Max. Power Diss. (W) | 1.5 |
C(iss) Max. (F) | 240p |
I(D) Abs. Drain Current (A) | 1.6 |
I(D) Abs. Max.(A) Drain Curr. | 1.0 |
I(DM) Max (A)(@25°C) | 6.4 |
I(DSS) Max. (A) | 1.0m |
I(DSS) Min. (A) | 100u |
I(GSS) Max. (A) | 100n |
Military | N |
Package | SOT-223 |
Thermal Resistance Junc-Amb. | 85 |
V(BR)DSS (V) | 60 |
V(BR)GSS (V) | 30 |
V(GS)th Max. (V) | 4.0 |
V(GS)th Min. (V) | 2.1 |
g(fs) Max, (S) Trans. conduct, | 1.5 |
g(fs) Min. (S) Trans. conduct. | 1.0 |
r(DS)on Max. (Ohms) | 350m |
t(d)off Max. (s) Off time | 20n |
t(f) Max. (s) Fall time. | 25n |
t(r) Max. (s) Rise time | 35n |
td(on) Max (s) On time delay | 10n |